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公开时间: 2009-04-22      申请时间: 2008-11-27
申请人: UNIV TIANJIN

CN101413972A
patent for invention


标题(英语)

System and method for testing electric resistivity of thin film thermoelectricity material


摘要(英语)

The invention relates to a thin-film thermoelectric material resistivity test system and a method. The test system adopts a new thin-film thermoelectric material resistivity test instrument which is based on the principles of dual electro-testing and four probes to test the resistivity of a thin film thermoelectric material and is composed of a test fixture and a control and test circuit system. A thin film thermoelectric material sample to be tested is arranged in the test fixture, and the test fixture is connected with the control and test circuit system by a probe guide wire. The control and test circuit system gives pulse current signals to two of the four probes in the test fixture by the probe guide wires and collects voltage response signals between another two probes, the pulse current signals and the voltage response signals are simultaneously input in a micro-computer, and the real-time resistivity of the thin film thermoelectric material at the tested position is displayed on a display screen of the micro-computer. The test system and the method can greatly reduce the impacts of the distances among the probes and the transverse wandering of the probe tips on the resistivity test result, and the test precision can not be affected even the tested piece is smaller and the probes are positioned in the vicinity of the sample boundary.


申请人详细信息

序号 名称 数据格式
1 UNIV TIANJIN docdb

发明人详细信息

序号 名称 数据格式
1 WEI WANG docdb
2 FEIHUI LI docdb
3 JINLOU LI docdb
4 YANG WANG docdb

法律状态

序号 日期 法律代码 详细信息
1 20090422 C06 PUBLICATION
2 20090617 C10 ENTRY INTO SUBSTANTIVE EXAMINATION
3 20110511 C14 GRANT OF PATENT OR UTILITY MODEL

文档历史

公开时间: 2009-04-22
CN101413972A
申请时间: 2008-11-27
CN200810153570

CPC分类


IPC分类

G01R27/02

专利家族

40594605

被引非专利信息

引用阶段 文档类型 文档信息

被引专利信息

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