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公开时间: 2005-02-16      申请时间: 2004-05-19
申请人: UNIV NANKAI

CN1580792A
patent for invention


标题(英语)

Method and device for measuring super conducting film surface resistance


摘要(英语)

The present invention relates to a method for measuring surface resistance and its device, which is used for detecting metal material and superconducting material, in particular, it is a method and measuring device for detecting surface resistance of high-temperature superconducting film material. It adopts a medium-loaded resonator whose one end is short-circuited and another end is in opened state. It can respectively measure two microwave media loaded resonant cavities in which the decribed microwave media are respectively formed from two medium columns which are identical in material and length and different in diameter, so that it can define the system quality factor value Qr correspondent to other loss except tested sample, and further can meausre tested sample so as to obtain the surface resistance R of tested sample.


申请人详细信息

序号 名称 数据格式
1 UNIV NANKAI docdb

发明人详细信息

序号 名称 数据格式
1 YAN SHAOLIN docdb
2 ZHANG XU docdb
3 FENG HONGHUI docdb

法律状态

序号 日期 法律代码 详细信息
1 20050216 C06 PUBLICATION
2 20050420 C10 ENTRY INTO SUBSTANTIVE EXAMINATION
3 20070801 C14 GRANT OF PATENT OR UTILITY MODEL
4 20090722 C19 LAPSE OF PATENT RIGHT DUE TO NON-PAYMENT OF THE ANNUAL FEE

文档历史

公开时间: 2005-02-16
CN1580792A
申请时间: 2004-05-19
CN200410019248

CPC分类


IPC分类

G01R27/02

专利家族

34581858

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