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公开时间: 2006-03-30      申请时间: 2004-09-15
申请人: MATSUSHITA ELECTRIC IND CO LTD

JP2006086252A
patent for invention


标题(英语)

RESISTANCE VALUE MEASURING DEVICE OF FILM RESISTOR


摘要(英语)

PROBLEM TO BE SOLVED: To provide a measuring device which is capable of measuring the resistance value of a film resistor accurately through a four-contact structure consisting of electrodes which serve as a tapered chuck which pinches an electrode contact probe equipped with a whirl stop mechanism and the electrodes while the resistance value of the film resistor is corrected.

SOLUTION: The resistance value measuring device measuring the resistance value of the film resistor is composed of the chuck 1 which has a function of serving as a contact, pinching the film resistor 18; the electrode contact probe 3 electrically insulated from the chuck 1 with an insulating sleeve 2; a whirl stop holder 4 and a whirl stop block 5 which are both used to rotate the electrode contact probe 3 and the chuck 1, synchronizing them with each other; and an irregularly-pitched spring 6 which firmly fastens the whirl stop block 5 to an electrode pin 7, making the electrode contact probe 3 bear against the film resistor 18.

COPYRIGHT: (C)2006,JPO&NCIPI


申请人详细信息

序号 名称 数据格式
1 MATSUSHITA ELECTRIC IND CO LTD docdb

发明人详细信息

序号 名称 数据格式
1 IMANAKA SEIJI docdb
2 TAKAHASHI MASAHARU docdb

法律状态

序号 日期 法律代码 详细信息
1 20060316 A621 WRITTEN REQUEST FOR APPLICATION EXAMINATION
2 20060413 RD01 NOTIFICATION OF CHANGE OF ATTORNEY
3 20070614 A761 WRITTEN WITHDRAWAL OF APPLICATION

文档历史

公开时间: 2006-03-30
JP2006086252A
申请时间: 2004-09-15
JP2004267925

CPC分类


IPC分类

H01C17/22

专利家族

36164516

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